About AX2820 Test System
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| 102 South Street Hopkinton,MA 01748 info@testevolution.com 1-781-644-2111 All rights reserved; 2010 Test Evolution Corp |
Information
Corporate
| Test Evolution AX2820 Test System |
The AXIe ATE Test Head is a modular
design containing two 14-slot AXIe 3.1
chassis that accept AXIe cards and one
20-slot PXI chassis that accepts 3U PXI
form factor cards. The rugged light
weight aluminum frame uses precision
pins & bushings to locate and reference
AXIe 3.1 backplanes, extender cards,
load board and docking assemblies.
Docking
The test head accepts a standard
4-point Docking Plate assembly and
probe tower assemblies up to 320 mm
diameter. It can be used with
manipulators using an 358 mm x 314
mm aluminum plates attached to the
frame.
The test head accepts a standard
4-point Docking Plate assembly and
probe tower assemblies up to 320 mm
diameter. It can be used with
manipulators using an 358 mm x 314
mm aluminum plates attached to the
frame.
Load Board
The Test Head accepts a 406 mm x 457
mm Device Interface (load) Board.
Connections to the load board include up
to 4160 Instrument I/O channels, VHDM
DUT power receptacles, and up to 72
Blind-mate SMA coaxial connections. For
easy changeover, a handle operate
system easily docks and undocks load
board assemblies.
The Test Head accepts a 406 mm x 457
mm Device Interface (load) Board.
Connections to the load board include up
to 4160 Instrument I/O channels, VHDM
DUT power receptacles, and up to 72
Blind-mate SMA coaxial connections. For
easy changeover, a handle operate
system easily docks and undocks load
board assemblies.
ATE Rack
The test head is used with a EIA
compliant 19” equipment rack. The Test
System requires a 240 Vac, 50/60 Hz, 60
A, Single Phase supply and is internally
protected by circuit breakers. The rack
supplies power to the test head and
contains a 5 1/2-digit DMM for system
calibration.
The test head is used with a EIA
compliant 19” equipment rack. The Test
System requires a 240 Vac, 50/60 Hz, 60
A, Single Phase supply and is internally
protected by circuit breakers. The rack
supplies power to the test head and
contains a 5 1/2-digit DMM for system
calibration.
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