About DD48
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| 102 South Street Hopkinton,MA 01748 info@testevolution.com 1-781-644-2111 All rights reserved; 2010 Test Evolution Corp |
Information
Corporate
| Dynamic Digital Subsystem with 48 Flexible Digital Channels |
Pattern Generator Features
- 32M Unrestricted (128M in High
Speed Mode) vector memory - 3 unique 1G SCAN chains per board
- 128M digital sample source/capture
memory parallel per channel - Match mode, parallel and serial.
- Flexible micro-instructions
supporting nested loops and - subroutines
- Flexible mixed signal triggering
- 8-channel granularity of most
functions for test & cost efficiency
Timing & Formatting Features
- 100/200/400 Mvps data rates
- 32 per pin flexible edge sets
- 32 period sets (10ns to 671mS
periods) - 127 global timing sets on the fly
- Window and strobe compare
formats - Flexible drive formats supporting
mixed-signal applications - 4 flexible edges per pin for unique
formats & applications
Applications
- Characterization and Validation
- Multi-Site Automated Production
Test - Low-cost IC Test
- Mixed Signal Test
- Wafer Sort
Driver, Comparator & Load Features
- 3 level driver ( Vih, Vil, Vtt)
- -2v to +6.0v Range
- Active load up to 12mA source
and sink - 1 high voltage driver (12v) per 8
pins
Per Pin PMU Features
- Force Voltage, Measure Current
- Force Current, Measure Voltage
- Voltage clamps
- 5 current ranges (2uA to 32mA)
- -2v to +6.0v Range
- Hardware measurement
averaging & histogram support
Test Evolution Corporation
Evolving Technology for Test
